The Handbook of Surface and Nanometrology
David J. Whitehouse
Unique book explains and challenges current concepts in nanotechnology. Covers in great detail surface metrology and nanometrology and more importantly the areas where they overlap, thereby providing a quantitative means of controlling and predicting processes and performance. Practical examples included.
カテゴリー:
年:
2002
版:
1
出版社:
Taylor & Francis
言語:
english
ページ:
1128
ISBN 10:
0750305835
ISBN 13:
9780750305839
ファイル:
PDF, 46.02 MB
IPFS:
,
english, 2002